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17/30366375 DC

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17/30366375 DC

BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) partTitleEN sectionTitleEN

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Author BSI
Editor BSI
Document type Draft
Format File
ICS 31.080.30 : Transistors
Number of pages 16
Year 2017
Country United Kingdom